Waviks logo TEM/SEM/FIBWaviks was founded in 2013 by Dr. Tom Moore in Dallas, TX, to develop and produce innovative accessories for heating in TEM/SEM/FIB and HIM to facilitate nanoanalysis and nanofabrication. Waviks core team has enjoyed more than 50 years of experience in designing and producing nanomanipulation and nanofabrication accessories for Omniprobe, Inc., now an Oxford Instruments company. Waviks carries on the tradition of high value accessories and a focus on customer satisfaction that can best be provided by a small and agile corporation. Contact us for a quote.

State-of-the-art nanoscale and atomic level imaging and characterisation are significant challenges for science and engineering. Advances in new materials, devices, and cell biology that span all engineering and science disciplines are predicated on understanding fundamental structure-composition-property relationships. The Transmission Electron Microscope (TEM) has become ubiquitous for directly imaging and understanding the properties of materials at the atomic scale. Wavik’s cornerstone product, the Vesta® laser sample heating system, was originally developed for the TEM, and is now also available for the SEM, FIB and HIM.

Waviks photo-thermal-pathways for heating in TEM/SEM/FIBWaviks cornerstone product is the Vesta® laser sample heating system for the TEM, SEM and FIB. The Vesta® system relies on Waviks expertise in fully programmable nanomanipulators and the physics of nanofabrication. The Vesta® system produces a very small (10 um) heated area on the sample, so fast temperature ramping is easy and multiple sites on the same sample can be examined. There is no thermal damage to detectors or the column, and there is minimal thermal-mechanical drift in the sample, so long duration studies and movies are easy. The laser can be pulsed to look at transient events. On the analytical side, EEGS (Electron Energy Gain Spectroscopy) with laser stimulation is possible.

Innovative multi-spectral probe contains three customisable optical channels with very low-loss delivery, high power density on the sample, and can function in both pulsed and continuous modes. Waviks’ Vesta™ Compact Nanomanipulator features saved locations for focus of each laser wavelength and precision control that allows you to easily and independently probe different areas on the sample. Waviks’ Master Controller and software provide user-friendly integrated control of all laser power and pulsing, motion control, and saved locations. The embedded Win10 PC is controllable independently, from the microscope’s PC via ethernet cable, or remotely from anywhere by IP address.


Electron Energy Gain Spectroscopy (EEGS)

The Waviks Vesta™ is the first commercially available system capable of performing in situ EEGS in the TEM. This technique reveals hyperfine details in the optical response of individual nanoparticles paired with the incredible spatial resolution achieved in the TEM. The Vesta™ is available with a variety of wavelengths as well as an option for a tunable source depending on what materials and processes your group is interested in.


Sample Heating

The Vesta™ offers users many advantages when compared to traditional resistive or MEMS based heating holders. Users can conduct multiple experiments on the same sample using the 10 μm spot size produced by the Vesta™. Practically, there is no high temperature limit for thin films in the TEM and the sample temperature can be rapidly and repeatedly ramped with less than a 10 ns rise time. The Vesta™ does not require expensive one-time-use sample holders and is compatible with all TEMs. The Vesta™ produces little or no thermal movement of the sample during heating and does not cause radiative damage to any other detectors in the TEM chamber.


Ion Beam Damage Mitigation

Focused helium and neon ion beam microscopes are pushing the limits of metrology and direct-write nanoscale synthesis. The potential for ion beam induced swelling and damage to the sample is a risk with these methods. The Vesta™ pulsed laser assist provides highly localised in situ mitigation of subsurface damage by greater than 90%. This allows users to image at higher current for better resolution without milling away the sample surface.


Sample Cleaning

The Vesta™ gives users the ability to clean unwanted byproducts off the surface of a sample before conducting analytical techniques. This is particularly advantageous for those doing surface analysis using electron backscatter diffraction, Auger electron spectroscopy, and X-Ray photoelectron spectroscopy.