# Conductive AFM Probes

Showing all 16 results

##### CSG01/Au

Contact SPM probes CSG01 series with Au conductive coating, resonant frequency 4-17kHz, force constant 0,003-0,13N/m

##### CSG01/Pt

Contact SPM probes CSG01 series with Pt conductive and reflective coatings, resonant frequency 4-17kHz, force constant 0,003-0,13N/m

##### CSG10/Au

Contact SPM probes CSG10 series with Au conductive coating, resonant frequency 8-39kHz, force constant 0,01-0,5N/m

##### CSG10/Pt

Contact SPM probes CSG10 series with Pt conductive and reflective coatings, resonant frequency 8-39kHz, force constant 0,01-0,5N/m.

##### CSG30/Pt

NEW PRODUCT! for CONTACT/SEMICONTACT modes CSG30 series with Pt conductive and reflective coatings, resonant frequency 26-76kHz, force constant 0.6-2 N/m. Specially designed for the applications when it's not clearly defined which mode should be used for sample investigation or when it's necessary to provide measurements in both modes of the same sample area without tip remove.

##### FMG01/Au

Force Modulation Cantilevers FMG01 with Au conductive coating. Thickness of the coating is 20-30nm. Typical tip curvature radius is 35nm. For Force Modulation Mode FMG01 series with Au conductive coating, resonant frequency 47-90kHz, force constant 1-5N/m

##### FMG01/Pt

Force Modulation Cantilevers FMG01 with PtIr conductive coating. Thickness of the coating is 20-30nm. Typical tip curvature radius is 35nm. For Force Modulation Mode FMG01 series with PtIr conductive and reflective coatings, resonant frequency 47-90kHz, force constant 1-5N/m

##### FMG01/TiN

Force Modulation Cantilevers FMG01 with TiN conductive coating. Thickness of the coating is 20-30nm. Typical tip curvature radius is 35nm. For Force Modulation Mode FMG01 series with TiN conductive coating, resonant frequency 40-96 kHz, force constant 1-5N/m

##### NSG01/Au

Noncontact cantilevers NSG01, NSG10, NSG03, NSG30, FMG01 series with Au conductive coating. Thickness of the coating is 20-30nm. Typical tip curvature radius is 35nm. Noncontact SPM probes NSG01 series with Au conductive coating, resonant frequency 87-230kHz, force constant 1,45-15,1N/m

##### NSG01/Pt

Noncontact SPM probes NSG01 series with PtIr conductive and reflective coatings, resonant frequency 87-230kHz, force constant 1,45-15,1N/m

##### NSG01/TiN

Noncontact SPM probes NSG01 series with TiN conductive coating, resonant frequency 87-230kHz, force constant 1,45-15,1N/m

##### NSG03/Pt

Noncontact/semicontact probes NSG03 series with Pt conductive and reflective coatings, resonant frequency 47-150kHz, force constant 0,35-6,1N/m

##### NSG10/Au

Noncontact cantilevers NSG01, NSG10, NSG03, NSG30, FMG01 series with Au conductive coating. Thickness of the coating is 20-30nm. Typical tip curvature radius is 35nm. Noncontact SPM probes NSG10 series with Au conductive coating, resonant frequency 140-390kHz, force constant 3,1-37,6N/m

##### NSG10/Pt

Noncontact SPM probes NSG10 series with PtIr conductive and reflective coatings, resonant frequency 140-390kHz, force constant 3,1-37,6N/m

##### NSG30/Au

Noncontact cantilevers NSG01, NSG10, NSG03, NSG30, FMG01 series with Au conductive coating. Thickness of the coating is 20-30nm. Typical tip curvature radius is 35nm. Noncontact probes NSG30 series with Au conductive coating, resonant frequency 240-440kHz, force constant 22-100N/m

##### NSG30/Pt

Noncontact probes NSG30 series with PtIr conductive and reflective coating, resonant frequency 240-440kHz, force constant 22-100N/m