AFM Calibration (individual)
Showing all 7 results
TGQ1
Calibration grating TGQ1 is intended for simultaneous calibration in X,Y,and Z directions.
TGT1
Test grating TGT1 is intended for for 3-D visualization of the scanning tip, determination of tip sharpness parameters, tip degradation and contamination control
TDG01
Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.
TGF1
Test grating TGF1 is intended for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity and lateral force calibration
TGG1
Test grating TGG1 is intended for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, detection of angular distortion, tip characterization
TGX1
Test grating TGX1 is intended for lateral calibration of SPM scanners, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip aspect ratio