HA_FM/W2C+

A$ 482A$ 1,319

High Accuracy High Resonance frequency noncontact AFM probes HA_FM series with stable and wear-resistant long lifetime W2C conductive coating, each chip has 2 cantilevers,resonant frequency 114 kHz / 77 kHz, force constant 6 N/m / 3.5 N/m. W2C+ conductive coating is modified to provide better stability in high humidity conditions

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SKU: E11 Category:

Description

Looking for the World’s best Conductive AFM? Click here.

ETALON is a new series of excellent composite AFM probes.
In terms of quality-to-price ratio, it has no analogues in the world market. NanoTechnology Solutions is the exclusive distributor of these probes in Australia and New Zealand.
High Accuracy High Resonance frequency non-contact AFM probes HA_FM series with stable and wear-resistant long lifetime W2C conductive coating.
The main advantages of W2C coated probes are:
  • Hard coating which stays stable at applied high voltages and flowing currents at the contact point ‘tip-sample’ which cannot be received with standard metal coated probes (Fig.1-3);
  • High conductivity (close to metal conductivity);
  • Typical curvature radius less than 35nm;
  • W2C+ was modified by volume doping with anticorrosion elements thus providing long-term performance in high humidity conditions.

 

Experiments, carried out in december 2015 by NT-MDT Spectrum Instruments, approved great stability of W2C+ coated probes under high voltage, current and tip-sample pressure. AFM cantilevers showed to be able measure current of several mkA during the whole scan without any degradation. The same excellent performance continued after 100 I-V curves by the range +/- 10V.

Specification of HA_FM/W2C probe series:
 Material
 Polysilicon lever,
 monocrystal silicon tip
 Chip size 3.6 x 1.6 x 0.4 mm
 Reflective side

Tip side

 Au (20-30 nm)

W2C (20-30 nm)

 Cantilever number 2 rectangular
 Tip shape Octahedral at the base, conic on the last 200 nm
 Tip cone angle φ 30 degrees on the last 200 nm
 Full tip height ≥10 µm
 Pedestal/tip ratio 1:1
 Tip curvature radius less than 35 nm

 

AFM probe

 

 

 

 

 

 

Cantilever typeABTypical dispersion
Length, L (µm)223183± 2
Width, W (µm)3434± 3
Thickness, H (µm)33± 0.15
Force Constant (N/m)3.56±20%
Resonant frequency (kHz)77114± 10%

Additional information

Weight N/A
Dimensions N/A
Package size

15, 50

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