HA_HR_DCP

Description

ETALON is a new series of excellent composite AFM probes.

In terms of quality-to-price ratio, it has no analogues in the world market.

Stable and nondestructive, wear resistant probes with conductive diamond coating allow you to make as many images as you want!

Specification of HA_HR_DCP probe series:

1. Material Material: Polysilicon lever, monocrystal silicon tip
2. Chip size: 3.6 x 1.6 x 0.4 mm
3. Reflective side: Au (20-30 nm)
4. Tip side: Highly doped diamond (~100nm thickness),  doping level:  6’000-8’000ppm B.
5. Cantilever number: 2 rectangular
6. Tip shape: Octahedral at the base, conic on the last 200 nm
7. Tip cone angle φ: 30 degrees on the last 200 nm
8. Full tip height: ≥10 µm
9. Pedestal/tip ratio: 1:1
10. Tip curvature radius: ~100nm

Cantilever type A specifications:

1. Length, L (µm): 93 ± 2
2. Width, W (µm): 34 ± 3
3. Thickness, H (µm): 3 ± 0.15
4. Force Constant (N/m): 34 ± 20%
5. Resonant frequency (kHz): 380 ± 10%

Cantilever type B specifications:

1. Length, L (µm): 123 ± 2
2. Width, W (µm): 34 ± 3
3. Thickness, H (µm): 3 ± 0.15
4. Force Constant (N/m): 17 ± 20%
5. Resonant frequency (kHz): 230 ± 10%

NanoTechnology Solutions is the exclusive distributor of these products in Australia and New Zealand.