A$ 1,522A$ 4,930

Stable and nondestructive, wear resistant probes with conductive diamond coating. High Accuracy High Resonance frequency noncontact AFM probes HA_HR series with doped diamond conductive coating, each chip has 2 cantilevers, resonant frequency 380 kHz / 230 kHz, force constant 34 N/m / 17 N/m

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SKU: E7 Category:


Looking for the World’s best Conductive AFM? Click here.

ETALON is a new series of excellent composite AFM probes.

In terms of quality-to-price ratio, it has no analogues in the world market. NanoTechnology Solutions is the exclusive distributor of these probes in Australia and New Zealand.
Stable and nondestructive, wear resistant probes with conductive diamond coating allow you to make as many images as you want!
Specification of HA_HR_DCP probe series:
 Polysilicon lever,
 monocrystal silicon tip
 Chip size 3.6 x 1.6 x 0.4 mm
 Reflective side

Tip side

 Au (20-30 nm)

Highly doped diamond (~100nm thickness),  doping level:  6’000-8’000ppm B.

 Cantilever number 2 rectangular
 Tip shape Octahedral at the base, conic on the last 200 nm
 Tip cone angle φ 30 degrees on the last 200 nm
 Full tip height ≥10 µm
 Pedestal/tip ratio 1:1
 Tip curvature radius ~100nm


AFM probe







Cantilever typeABTypical dispersion
Length, L (µm)93123± 2
Width, W (µm)3434± 3
Thickness, H (µm)33± 0.15
Force Constant (N/m)3417±20%
Resonant frequency (kHz)380230± 10%

Additional information

Weight N/A
Dimensions N/A
Package size

15, 50


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