A$ 482A$ 1,319

High Accuracy NonContact AFM probes HA_NC series with Au conductive coating, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m

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SKU: E14 Category:


ETALON is a new series of excellent composite AFM probes.

In terms of quality-to-price ratio, it has no analogues in the world market. NanoTechnology Solutions is the exclusive distributor of these probes in Australia and New Zealand.
Specification of HA_HR/Au probe series:
 Polysilicon lever,
 monocrystal silicon tip
 Chip size 3.6 x 1.6 x 0.4 mm
 Reflective side

Tip side

 Au (20-30 nm)

Au (20-30 nm)

 Cantilever number 2 rectangular
 Tip shape Octahedral at the base, conic on the last 200 nm
 Tip cone angle φ 30 degrees on the last 200 nm
 Full tip height ≥10 µm
 Pedestal/tip ratio 1:1
 Tip curvature radius less than 30 nm


AFM probe







Cantilever typeABTypical dispersion
Length, L (µm)93123± 2
Width, W (µm)3434± 3
Thickness, H (µm)33± 0.15
Force Constant (N/m)3417±20%
Resonant frequency (kHz)380230± 10%

Additional information

Weight N/A
Dimensions N/A
Package size

15, 50


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