Description
- Hard coating which stays stable at applied high voltages and flowing currents at the contact point ‘tip-sample’ which cannot be received with standard metal coated probes (Fig.1-3);
- High conductivity (close to metal conductivity);
- Typical curvature radius less than 35nm;
- W2C+ was modified by volume doping with anticorrosion elements thus providing long-term performance in high humidity conditions.
Experiments, carried out in december 2015 by engineers of NT-MDT Spectrum Instruments, approved great stability of W2C+ coated probes under high voltage, current and tip-sample pressure. AFM cantilevers showed to be able measure current of several mkA during the whole scan without any degradation. The same excellent performance continued after 100 I-V curves by the range +/- 10V.
Material | Polysilicon lever, monocrystal silicon tip |
Chip size | 3.6 x 1.6 x 0.4 mm |
Reflective side Tip side | Au (20-30 nm) W2C (20-30 nm) |
Cantilever number | 2 rectangular |
Tip shape | Octahedral at the base, conic on the last 200 nm |
Tip cone angle φ | 30 degrees on the last 200 nm |
Full tip height | ≥10 µm |
Pedestal/tip ratio | 1:1 |
Tip curvature radius | less than 35 nm |
Cantilever type | A | B | Typical dispersion |
Length, L (µm) | 94 | 124 | ± 2 |
Width, W (µm) | 34 | 34 | ± 3 |
Thickness, H (µm) | 1.85 | 1.85 | ± 0.15 |
Force Constant (N/m) | 12 | 3.5 | ±20% |
Resonant frequency (kHz) | 235 | 140 | ± 10% |
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