A$ 482A$ 1,367

AFM Probes for noncontact/semicontact modes NSG30 series, resonant frequency 240-440kHz, force constant 22-100N/m

Clear selection
SKU: G3 Category:


High Resolution NONCONTACT “GOLDEN” Silicon Cantilevers NSG30 series


NSG30 series specification

MaterialSingle Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size3.4×1.6×0.3mm
Reflective sideAu
Cantilever number1 rectangular
Tip curvature radiustypical 6nm, guaranteed 10nm
Available coatingsconductive PtIr, TiN, Au
Available probebare, tipless, with Al reflective coating





AFM Cantilever

Cantilever seriesCantilever length, L±5µmCantilever width, W±3µmCantilever thickness,

T±0.5 µm

Resonant frequency, kHzForce constant, N/m

Additional information

Weight N/A
Dimensions N/A
Package size

15, 50


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