Description
High Resolution NONCONTACT “GOLDEN” Silicon Cantilevers NSG30 series with PtIr conductive coating
NSG30/Pt series specification |
Material | Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped | Chip size | 3.4×1.6×0.3mm | Reflective side | Pt | Conductive coating | PtIr (25nm), Cr adhesion layer (25A) | Cantilever number | 1 rectangular | Tip curvature radius | ~ 35nm | Also available coatings | conductive TiN, Au | Available NSG30 probes | bare, tipless, with Al reflective coating |

| |
Cantilever series | Cantilever length, L±5µm | Cantilever width, W±3µm | Cantilever thickness, T±0.5 µm | Resonant frequency, kHz | Force constant, N/m |
min | typical | max | min | typical | max |
NSG30 | 125 | 40 | 4.0 | 240 | 320 | 440 | 22 | 40 | 100 |
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