A$ 651A$ 1,914

TOP VISUAL Contact AFM probes (typical resonant frequency 16 kHz, typical force constant 0,3 N/m), Al reflective coating

Clear selection
SKU: TV3 Category:


TOP VISUAL CONTACT Silicon Cantilevers VIT_P_C-A series
TOP VISUAL probes intended:

  1. For precise positioning of the tip over the point of interest and for direct real-time observation of sample scanning and modification (nanomanipulation) processes.
  2. For precise positioning of a tightly focused laser spot at the tip end – for investigations of optical effects between tip and sample (TERS, TEFS, s-SNOM etc).


  1. Material; Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
  2. Chip size: 3.4×1.6×0.3mm
  3. Reflective side coating: Al
  4. Front coating: None
  5. Cantilever number: 1 rectangular
  6. Tip curvature radius: typical 6nm, guaranteed 10nm
  7. Tip shape: Pyramidal
  8. Tip height: 14-16 um
  9. Cantilever length, L±20µm: 450
  10. Cantilever width, W±1µm: 50
  11. Cantilever thickness, T±1 µm: 2.5
  12. Resonant frequency, kHz: 8 (Min), 16 (Typical), 25 (Max)
  13. Force constant, N/m: 0.6 (Min), 0.3 (Typical), 1 (Max)

Additional information

Weight N/A
Dimensions N/A
Package size

15, 50


There are no reviews yet.

Be the first to review “VIT_P_C-A”

Your email address will not be published. Required fields are marked *