(1 customer review)

A$ 973A$ 2,942

TOP VISUAL Contact AFM probes (typical resonant frequency 16 kHz, typical force constant 0,3 N/m) with Pt conductive cover from both tip and reflective sides

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SKU: TV4 Category:


TOP VISUAL CONTACT Silicon Cantilevers VIT_P_C/Pt series
TOP VISUAL probes are intended:

  1. For precise positioning of the tip over the point of interest and for direct real-time observation of sample scanning and modification (nanomanipulation) processes.
  2. For precise positioning of a tightly focused laser spot at the tip end – for investigations of optical effects between tip and sample (TERS, TEFS, s-SNOM etc).

This model includes:

  1. Tip-side conductive cover made of Pt;
  2. Reflection-side cover for better AFM laser reflection made of Pt


  1. Material: Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
  2. Chip size: 3.4×1.6×0.3mm
  3. Reflective side coating: Pt
  4. Front coating: Pt
  5. Cantilever number: 1 rectangular
  6. Tip curvature radius: 25 – 35 nm
  7. Tip shape: Pyramidal
  8. Tip height: 14-16 um
  9. Cantilever length, L±5µm: 450
  10. Cantilever width, W±3µm: 50
  11. Cantilever thickness, T±0.5 µm: 2.5
  12. Resonant frequency, kHz: 8 (Min), 16 (Typical), 25 (Max)
  13. Force constant, N/m: 0.3 (Min), 0.6 (Typical), 1 (Max)


NanoTechnology Solutions is the exclusive distributor of these products in Australia and New Zealand.

Additional information

Weight N/A
Dimensions N/A
Package size

15, 50

1 review for VIT_P_C/Pt

  1. John

    Really easy to see how far the tip is from the region of interest. Especially critical for in-situ SEM work.

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