VIT_P/IR

Description

TOP VISUAL NONCONTACT Silicon Cantilevers VIT_P/IR series
TOP VISUAL probes intended:

1. For precise positioning of the tip over the point of interest and for direct real-time observation of sample scanning and modification (nanomanipulation) processes.
2. For precise positioning of a tightly focused laser spot at the tip end – for investigations of optical effects between tip and sample (TERS, TEFS, s-SNOM etc).

Specifications:

1. Material: Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
2. Chip size: 3.4×1.6×0.3mm
3. Reflective side coating: Au
4. Front coating: None
5. Cantilever number: 1 rectangular
6. Tip curvature radius: typical 30nm
7. Tip shape: Pyramidal
8. Tip height: 14-16 um
9. Cantilever length, L±5µm: 140
10. Cantilever width, W±3µm: 50
11. Cantilever thickness, T±0.5 µm: 5
12. Resonant frequency, kHz: 200 (Min), 300 (Typical), 400 (max)
13. Force constant, N/m: 25 (Min), 50 (Typical), 95 (max)