Instruments by type
Choose a type of instrument. Prefer to start from what you need to measure? Browse by application or technique.
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Electron Microscopy
Benchtop and full-size SEMs, detectors, stages, EDS-EBSD and precession diffraction -
Sample Preparation
Sputter coaters, ion beam polishers, plasma cleaners and automated graphene liquid cell fabrication for electron microscopy -
AFM and Surface Metrology
Atomic force microscopes, stylus profilers and 3D optical profilers -
Materials Testing
Nanoindenters, tensile, compression and bending stages, and thermal conductivity -
Surface and Interfacial Analysis
Contact angle, surface energy, surface tension and critical micelle concentration -
Nanofibre Synthesis
Lab, pilot and industrial-scale electrospinning systems -
Coating Systems
Benchtop and industrial ultrasonic spray coating systems -
In-Situ Analysis
Heating, cooling, tensile and indentation stages for SEM, TEM, X-ray CT and XRD, and liquid cells -
Vibration Isolation
Optical tables, breadboards, workstations and active isolation