Applications and techniques
Start from what you need to measure, image or make. Know the instrument already? Browse by instrument type.
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Electron Microscopy
Imaging and analysis with SEM, and in-situ work in TEM/SEM/FIB
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Microscopy Sample Preparation
Coating, polishing and cleaning samples for SEM, TEM and XPS
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In-Situ Analysis
Testing samples inside SEM, FIB, AFM, optical and X-ray instruments
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Mechanical Property Analysis
Hardness, modulus, tensile and compression testing
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Electrical Characterisation
Conductive AFM for conductive, insulating and soft materials
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Surface Metrology
Step height, roughness and topography by stylus and optical profiling
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Contact Angle and Surface Energy
Wettability, surface energy and powder contact angle
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Surface and Interfacial Tension
Tensiometer measurements of liquids, surfactants and powders
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Vibration-Sensitive Work
Isolation for optics, semiconductor, life science and microscopy
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Nanofibre Production
Electrospinning nanofibres for research and manufacturing
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Thin-Film Coating
Ultrasonic spray coating for research and production
By industry
The same instruments in production and industrial laboratories.
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Semiconductors and Electronics
Process metrology, wafer and device characterisation, vibration control for fabs
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Solar and Energy
Solar cell topography and film thickness, fuel cell catalyst coatings
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Manufacturing and Quality Control
Surface metrology, step height and roughness in production
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Mining and Geoscience
SEM with EDS for mineral and elemental analysis, laser ablation pit measurement for geochronology
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Filtration and Textiles
Nanofibre membranes from pilot to industrial-scale electrospinning
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Medical and Life Science
Tergeo plasma cleaners, biomedical nanofibres and vibration-free life science imaging
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Materials and Advanced Manufacturing
Nanoindentation, in-situ mechanical testing, nanofibres and precision coatings for new materials
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Microscopy and Microanalysis
SEM imaging, EDS and EBSD microanalysis, electron diffraction, AFM and sample preparation