CSInstruments ResiScope III: resistance and current mapping over 10 decades in one AFM scan, from highly conductive to highly insulating domains.
Key features
- 10 decades in one scan
- Conductive and insulating domains measured in the same image, without adjusting gains.
- Fast autogain
- Adjusted in real time by DSP electronics; multiple linear gains, no logarithmic amplifiers.
- Current protection
- Real-time integrated protection of tip and sample.
- ResiScope III
- Better accuracy and lower background noise; simultaneous PFM and ResiScope.
- Combined modes
- Works with oscillating mode, EFM/MFM and HD-KFM.
- Applications
- Semiconductors, photovoltaics, batteries and advanced materials.
Specifications
From Concept Scientific Instruments' product page.
| Range | 50 fA to 1 mA; 100 Ω to 1 TΩ (10 orders of magnitude) |
|---|---|
| Noise floor | < 30 fA RMS |
| Measurement speed | 10 kHz |


