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ResiScope current map of a battery material, 60 × 60 µm
Images: CSInstruments

ResiScope III Conductive AFM Module

CSInstruments ResiScope III: resistance and current mapping over 10 decades in one AFM scan, from highly conductive to highly insulating domains.

Key features

10 decades in one scan
Conductive and insulating domains measured in the same image, without adjusting gains.
Fast autogain
Adjusted in real time by DSP electronics; multiple linear gains, no logarithmic amplifiers.
Current protection
Real-time integrated protection of tip and sample.
ResiScope III
Better accuracy and lower background noise; simultaneous PFM and ResiScope.
Combined modes
Works with oscillating mode, EFM/MFM and HD-KFM.
Applications
Semiconductors, photovoltaics, batteries and advanced materials.

Specifications

From Concept Scientific Instruments' product page.

ResiScope III
Range 50 fA to 1 mA; 100 Ω to 1 TΩ (10 orders of magnitude)
Noise floor < 30 fA RMS
Measurement speed 10 kHz

Resources

Applications