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Bruker XFlash 7T EDS detector for TEM
Photos and application images: Bruker

QUANTAX EDS for TEM

Bruker EDS for STEM, TEM and T-SEM: XFlash 7T slim-line detectors and ESPRIT software for nanometre and atomic-scale mapping.

Request a quote (08) NANO TECH Manufacturer's product page QUANTAX EDS for TEM on bruker.com

Key features

Microscopes
Configured for each STEM, TEM or SEM (T-SEM): slim-line detector design optimised for the microscope's pole piece and EDS flange.
Collection
Maximum collection and take-off angles for fast, highly sensitive acquisition.
Clean data
Designed to avoid mechanical and electromagnetic interference, and to minimise specimen tilt, absorption, shadowing and system peaks.
Atomic-scale mapping
Drift correction for periodic structures (atoms, layers) and a fast-moving, stable detector stage.
TEM quantification
Cliff-Lorimer (theoretical and experimental factors) and Zeta-factor methods, with interpolation of missing Zeta-factors and absorption correction.
In-situ experiments
Time-resolved acquisition saves a stream of changing data, for example at elevated temperatures.
Automation
Scripting and API options for specific analysis jobs and batch processing; off-line analysis for student or laboratory networks.

Specifications

From Bruker's product page.

QUANTAX EDS for TEM
Upper energy limit 80 keV
Stable resolution 1 Å
High-energy element lines Above 40 keV, available for quantification
Quantification approaches 3: theoretical and experimental Cliff-Lorimer factors, and Zeta-factors
Background models 3: physical (bulk), physical (thin lamellae) and mathematical
Detector XFlash 7T
XFlash 7 detector family source
Largest solid angle > 1.1 sr
Analytical throughput Up to 1,000 kcps (ISO 15632:2021)
Atomic database More than 2,200 element lines
Uptime SDD module exchange on site

Resources

Webinars and videos

From the manufacturer's own channels.

Applications