Nano-Observer II Atomic Force Microscope
CSInstruments Nano-Observer II: a research AFM with ResiScope III, HD-KFM III and Soft Intermittent Contact among more than 20 modes on one head.
Key features
- 20+ modes, one head
- Contact, resonant and Soft Intermittent Contact imaging; electrical, nanomechanical, magnetic, thermal and environmental modes.
- ResiScope III
- Resistance from 10² to 10¹² Ω, fA to µA current, in one scan.
- HD-KFM III
- Surface potential on the second eigenmode, with the tip 0.1–0.5 nm from the surface.
- AutoScan software
- Automatic approach, real-time autogain and preset setpoints.
- Easy set-up
- Top and side views of tip and sample; optional pre-aligned tip/laser holder.
- Options
- Glovebox use, illumination arm (20–90°) and AFM-IR.
Specifications
From Concept Scientific Instruments' product page.
| XY scan range | 100 × 100 µm, closed loop |
|---|---|
| Z range | 15 µm |
| Controller | 24-bit Galaxy USB controller with built-in lock-ins |
| Samples | Up to 52 mm diameter, 20 mm high |
| Modes | 20+ on one head, upgradable |
| Resistance range | 10²–10¹² Ω (10 decades in one scan) |
|---|---|
| Current | fA to µA |
| Noise floor | < 30 fA RMS |
| Measurement speed | 10 kHz |
Resources
- Product guide Scanning Probe Microscopy
- Article 5 Critical Factors When Comparing Scanning Electron Microscope Prices
- Article O₂ vs H₂ vs Ar: The Proven Plasma Cleaning Gas Selection Framework
- Article The best Conductive AFM for polymers and soft materials
- Article The most advanced module for Conductive AFM
