Skip to content
Bruker XFlash 7 EDS detector
Photos: Bruker

QUANTAX EDS for SEM

Bruker's complete EDS system for SEM, FIB-SEM and EPMA: XFlash 7 detectors and ESPRIT software for fast, high-resolution elemental analysis and mapping.

Request a quote (08) NANO TECH Manufacturer's product page QUANTAX EDS on bruker.com

Key features

XFlash 7 detectors
Largest solid angle and highest throughput in Bruker's range, with support for low-kV and light-element analysis.
Spectral performance
Best-in-class energy resolution, according to Bruker.
Microscopes
For SEM, FIB-SEM and EPMA.
Less downtime
Detector modules can be exchanged on site.
Quantification
Standardless and standard-based.
Correlative analysis
EDS together with EBSD and micro-XRF on SEM in the integrated ESPRIT software.

Specifications

From Bruker's product page.

XFlash 7 detector range
XFlash 7200 FIRE Flagship, inclined four-channel detector
XFlash 7100oval Oval single-channel detector with inclined geometry, suited to light-element analysis
XFlash FlatQUAD 2L Annular detector that maximises solid angle
XFlash 7 Detector family with a range of active areas
XFlash 730M Compact detector for routine SEM work
XFlash 7200 FIRE source
Output count rate Up to 2,400,000 cps
Total active area 200 mm² (four detector segments)
Signal processing 4× parallel
Spectrum range Up to 30 keV
STEM-in-SEM EDS Up to 30 kV

Resources

Webinars and videos

From the manufacturer's own channels.

Applications