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AFM/SPM
Atomic Force Microscope
The most advanced Conductive AFM
Conductive AFM for polymers and soft materials
Vibration Isolation for Semiconductor, Metrology, and Display applications
Active Vibration Isolation Systems
ELECTRON MICROSCOPY
Desktop SEM
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Sputter Coater
Ion Beam Polisher
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Nanoindentation in SEM
Laser Heating
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TEM Holder Plasma Cleaning
Sample Plasma Cleaning
Graphene Liquid Cells
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Stylus Profilers
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Surface Profilers for Metrology
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Optical Profilers for Solar Cells
Optical Profilers for Microfluidics
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Contact Angle Analysis
Portable Contact Angle Analysers
Phoenix MT Series
Surface Tensiometers
Thermal Conductivity Measurements
Critical Micelle Concentration Measurements
Density Measurements
Interfacial Tension Measurements
Penetration Measurements
Sedimentation Measurements
Instrumentation for in-situ
Tensile Testing for SEM, AFM, optical
Peltier Cooling stages for SEM
Laser Heating in TEM/SEM/FIB
Nanoindenters for SEM, FIB, Raman, AFM
Tensile stages for µXCT
SEM Chamber Plasma Cleaning
Ultrasonic Coating Systems
Benchtop Series PRISM400
Industrial Series PRISM500/800
Drawbacks of Ultrasonic Nozzle: And the “Nozzle-less” difference
Ultrasonic Coatings for Fuel Cell Application
Mechanical Property Analysis
The World’s Best Nanoindenter
Tensile & Compression Testing
in-situ Nanoindenters for SEM, FIB, Raman, AFM
in-situ tensile stages for µXCT/XRD
Sample Preparation Portfolio
Sputter Coater for SEM
Ion Beam Polisher for SEM
Sample Plasma Cleaning
Graphene Liquid Cells
TEM Holder Plasma Cleaning
Electrospinning Systems
Lab Scale Systems
Pilot Scale Systems
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Innovations in Technology
R&D Trials and Services
Precession ED in TEM
Other Products
EDS-EBSD module for Benchtop SEM
The World’s Best Nanoindenter
Full-Size SEM
VitroTEM Benchtop Device for Graphene Liquid Cells
Ion Beam Polisher for SEM
Sputter Coater for SEM
Benchtop Vibration Isolation
Pneumatic Isolators for Dynamic Stages
