CSG01/Pt

Contact SPM probes CSG01 series with Pt conductive and reflective coatings, resonant frequency 4-17kHz, force constant 0,003-0,13N/m

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SKU: G20 Category:

Description

High Resolution CONTACT “GOLDEN” Silicon Cantilevers CSG01 series with PtIr conductive coating

CSG01/Pt series specification:

  1. Material: Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
  2. Chip size: 3.4×1.6×0.3mm
  3. Reflective side: PtIr
  4. Conductive coating: PtIr (25nm), Cr adhesion layer (25A)
  5. Cantilever number: 1 rectangular
  6. Tip curvature radius: ~ 35nm
  7. Also available coatings: conductive TiN, Au
  8. Available CSG01 probe : bare, tipless, with Al reflective coating

Cantilever specification:

  1. Cantilever length, L±5µm: 350
  2. Cantilever width, W±3µm: 30
  3. Cantilever thickness, T±0.5 µm: 1.0
  4. Resonant frequency, kHz: 4 (Min), 9.8 (Typical), 17 (max)
  5. Force constant, N/m: 0.003 (min), 0.03 (Typical), 0.13 (Max)

Additional information

WeightN/A
DimensionsN/A
Package size

15, 50

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