NanoTechnology Solutions
CSG01/Pt
Contact SPM probes CSG01 series with Pt conductive and reflective coatings, resonant frequency 4-17kHz, force constant 0,003-0,13N/m
Price on request
Available on back-order
Description
High Resolution CONTACT “GOLDEN” Silicon Cantilevers CSG01 series with PtIr conductive coating
CSG01/Pt series specification:
- Material: Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
- Chip size: 3.4x1.6x0.3mm
- Reflective side: PtIr
- Conductive coating: PtIr (25nm), Cr adhesion layer (25A)
- Cantilever number: 1 rectangular
- Tip curvature radius: ~ 35nm
- Also available coatings: conductive TiN, Au
- Available CSG01 probe : bare, tipless, with Al reflective coating
Cantilever specification:
- Cantilever length, L±5µm: 350
- Cantilever width, W±3µm: 30
- Cantilever thickness, T±0.5 µm: 1.0
- Resonant frequency, kHz: 4 (Min), 9.8 (Typical), 17 (max)
- Force constant, N/m: 0.003 (min), 0.03 (Typical), 0.13 (Max)
Options
| Package size | SKU | Price (ex GST) | Quote |
|---|---|---|---|
| 15 | G2015 | On request | Quote for CSG01/Pt 15 |
| 50 | G2050 | On request | Quote for CSG01/Pt 50 |