NSG01/Pt

Noncontact SPM probes NSG01 series with PtIr conductive and reflective coatings, resonant frequency 87-230kHz, force constant 1,45-15,1N/m

This product is currently out of stock and unavailable.

SKU: G11 Category:

Description

High Resolution NONCONTACT “GOLDEN” Silicon Cantilevers NSG01 series with PtIr conductive coating

 

NSG01/Pt series specification
 

MaterialSingle Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size3.4×1.6×0.3mm
Reflective sidePtIr
Conductive coatingPtIr (25nm), Cr adhesion layer (25A)
Cantilever number1 rectangular
Tip curvature radius~ 35nm
Also available coatingsconductive TiNAu;

magnetic CoCr

Available NSG01 probebare, tipless, with Al reflective coating

AFM Cantilever

 

 

 

Cantilever seriesCantilever length, L±5µmCantilever width, W±3µmCantilever thickness,

T±0.5 µm

Resonant frequency, kHzForce constant, N/m
mintypicalmaxmintypicalmax
NSG01125302.0871502301.455.115.1

Additional information

WeightN/A
DimensionsN/A
Package size

15, 50

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