NSG03

AFM probes for noncontact/semicontact modes NSG03 series, resonant frequency 47-150kHz, force constant 0,35-6,1N/m

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Description

High Resolution NONCONTACT “GOLDEN” Silicon AFM probes NSG03 series

 

NSG03 series specification
 

MaterialSingle Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size3.4×1.6×0.3mm
Reflective sideAu
Cantilever number1 rectangular
Tip curvature radiustypical 6nm, guaranteed 10nm
Available coatingsconductive PtIr, TiN, Au;
Available probebare, tipless, with Al reflective coating

 

AFM Cantilever

Cantilever seriesCantilever length, L±5µmCantilever width, W±3µmCantilever thickness,

T±0.5 µm

Resonant frequency, kHzForce constant, N/m
mintypicalmaxmintypicalmax
NSG03135301.547901500.351.746.1

 

Additional information

WeightN/A
DimensionsN/A
Package size

15, 50

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