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High Resolution NONCONTACT GOLDEN Silicon AFM Probes Budget sensors series

NSG30/Au

Noncontact cantilevers NSG01, NSG10, NSG03, NSG30, FMG01 series with Au conductive coating. Thickness of the coating is 20-30nm. Typical tip curvature radius is 35nm. Noncontact probes NSG30 series with Au conductive coating, resonant frequency 240-440kHz, force constant 22-100N/m

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SKU: G14 Category:

Description

High Resolution NONCONTACT “GOLDEN” Silicon Cantilevers NSG30 series with Au conductive coating

 

NSG30/Au series specification

 

 

MaterialSingle Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size3.4×1.6×0.3mm
Reflective sideAu
Conductive coatingAu (35nm), Ti adhesion layer (25A)
Cantilever number1 rectangular
Tip curvature radius~ 35nm
Also available coatingsconductive TiN, PtIr
Available NSG30 probebare, tipless, with Al reflective coating

 

AFM Cantilever

 

Cantilever seriesCantilever length, L±5µmCantilever width, W±3µmCantilever thickness,

T±0.5 µm

Resonant frequency, kHzForce constant, N/m
mintypicalmaxmintypicalmax
NSG30125404.02403204402240100

Additional information

WeightN/A
DimensionsN/A
Package size

15, 50

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