Nano Indenter G200X

KLA Nano Indenter G200X: KLA's highest-performing motion system, largest sample mounting and modular options up to high temperature.

Key features

Electromagnetic actuation: High dynamic range in force and displacement, with no lateral displacement artefacts.
Motion and optics: KLA's highest-performing XYZ motion system and a high-resolution optical microscope for targeting.
Throughput: Sample tray with multiple positions, and high-speed testing for property maps.
Modular options: Continuous stiffness measurement (CSM), SPM imaging, scratch and wear, frequency sweeps, electrical (I-V), high-speed, impact and high-temperature testing.
Software: InView with ReviewData and InFocus reporting; ISO 14577 test method included.
Applications: Hardness and modulus, thin films and coatings, adhesion, fracture toughness, viscoelastic properties and yield stress and strain.

Nano Indenter G200X
XP indentation head	500 mN loading; < 0.01 nm (10 pm) displacement resolution; > 500 µm maximum indentation depth
InForce actuators (options)	InForce 1000 (up to 1000 mN) and InForce 50 (up to 50 mN)
Data acquisition	100 kHz, 16 µs time constant (iQWave2)
Sample stage travel	100 mm in X and Y, 25 mm in Z
Survey scanning (option)	Up to 500 × 500 µm, 10 nm linear encoders
Sample heating (option)	Up to 300 °C, with inert gas backfill

From the manufacturer's own channels.