Topspin 4D-STEM Platform
NanoMEGAS Topspin: a digital STEM and beam-precession framework for 4D-STEM, phase and orientation mapping (ASTAR), strain mapping and EDX/EELS.
Key features
- 4D-STEM
- Collects a precession diffraction pattern at every point of a scanned image (with DigiSTAR).
- Orientation and phase
- ASTAR phase and orientation mapping.
- Strain
- Nanobeam precession diffraction resolves strain at the nanometre scale.
- Spectroscopy
- Enhanced EDX and EELS, with model-based EELS quantification.
- Direct electron detectors
- High-sensitivity, high-speed acquisition.
- Automated alignment
- Beam compensation and drift correction.
Specifications
From NanoMEGAS's product page.
| Spatial resolution | < 2 nm attainable (FEG TEM) |
|---|---|
| Strain sensitivity | < 2 × 10⁻⁴ (FEG TEM) |
| Beam compensation | 64 compensation points adjusted automatically; more can be added |
|---|---|
| Alignment | Sub-pixel accuracy at 580 × 580 camera resolution, using 16-bit images |
| Dynamic range | Full 14-bit range of diffraction patterns kept |
