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High Resolution NONCONTACT GOLDEN Silicon AFM Probes Budget sensors series

FMG01/Pt

Force Modulation Cantilevers FMG01 with PtIr conductive coating. Thickness of the coating is 20-30nm. Typical tip curvature radius is 35nm. For Force Modulation Mode FMG01 series with PtIr conductive and reflective coatings, resonant frequency 47-90kHz, force constant 1-5N/m

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SKU: G17 Category:

Description

High Resolution FORCE MODULATION “GOLDEN” Silicon Cantilevers FMG01 series with PtIr conductive coating

 

FMG01/Pt series specification
 

MaterialSingle Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size3.4×1.6×0.3mm
Reflective sidePtIr
Conductive coatingPtIr (25nm), Cr adhesion layer (25A)
Cantilever number1 rectangular
Tip curvature radius~ 35nm
Also available coatingsconductive TiN, Au;

magnetic CoCr

Available FMG01 probebare, tipless, with Al reflective coating

AFM Cantilever

Cantilever seriesCantilever length, L±5µmCantilever width, W±3µmCantilever thickness,

T±0.5 µm

Resonant frequency, kHzForce constant, N/m
mintypicalmaxmintypicalmax
FMG01225322.5477090135

 

Additional information

WeightN/A
DimensionsN/A
Package size

15, 50

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