Force Modulation Probes – NanoTechnology Solutions®

Uncoated AFM probes for Force Modulation Mode. Resonant frequency 40-96kHz, force constant 1-5 N/m

High Resolution NONCONTACT GOLDEN Silicon AFM Probes Budget sensors series

FMG01/Au

Force Modulation Cantilevers FMG01 with Au conductive coating. Thickness of the coating is 20-30nm. Typical tip curvature radius is 35nm. For Force Modulation Mode FMG01 series with Au conductive coating, resonant frequency 47-90kHz, force constant 1-5N/m

High Resolution NONCONTACT GOLDEN Silicon AFM Probes Budget sensors series

<img width="250" height="200" src="https://nanotechnologysolutions.com.au/wp-content/uploads/2017/10/High-Resolution-NONCONTACT-22GOLDEN22-Silicon-AFM-Probes-NSG01-series-NSG01.jpg" class="attachment-woocommerce_thumbnail size-woocommerce_thumbnail" alt="High Resolution NONCONTACT GOLDEN Silicon AFM Probes Budget sensors series" decoding="async" srcset="https://nanotechnologysolutions.com.au/wp-content/uploads/2017/10/High-Resolution-NONCONTACT-22GOLDEN22-Silicon-AFM-Probes-NSG01-series-NSG01.jpg 250w, https://nanotechnologysolutions.com.au/wp-content/uploads/2017/10/High-Resolution-NONCONTACT-22GOLDEN22-Silicon-AFM-Probes-NSG01-series-NSG01-150x120.jpg 150w" sizes="(max-width: 250px) 100vw, 250px" />

FMG01/Pt

Force Modulation Cantilevers FMG01 with PtIr conductive coating. Thickness of the coating is 20-30nm. Typical tip curvature radius is 35nm. For Force Modulation Mode FMG01 series with PtIr conductive and reflective coatings, resonant frequency 47-90kHz, force constant 1-5N/m

High Resolution NONCONTACT GOLDEN Silicon AFM Probes Budget sensors series

<img width="250" height="200" src="https://nanotechnologysolutions.com.au/wp-content/uploads/2017/10/High-Resolution-NONCONTACT-22GOLDEN22-Silicon-AFM-Probes-NSG01-series-NSG01.jpg" class="attachment-woocommerce_thumbnail size-woocommerce_thumbnail" alt="High Resolution NONCONTACT GOLDEN Silicon AFM Probes Budget sensors series" decoding="async" srcset="https://nanotechnologysolutions.com.au/wp-content/uploads/2017/10/High-Resolution-NONCONTACT-22GOLDEN22-Silicon-AFM-Probes-NSG01-series-NSG01.jpg 250w, https://nanotechnologysolutions.com.au/wp-content/uploads/2017/10/High-Resolution-NONCONTACT-22GOLDEN22-Silicon-AFM-Probes-NSG01-series-NSG01-150x120.jpg 150w" sizes="(max-width: 250px) 100vw, 250px" />

FMG01/TiN

Force Modulation Cantilevers FMG01 with TiN conductive coating. Thickness of the coating is 20-30nm. Typical tip curvature radius is 35nm. For Force Modulation Mode FMG01 series with TiN conductive coating, resonant frequency 40-96 kHz, force constant 1-5N/m