Skip to content
FMG01/TiN

NanoTechnology Solutions

FMG01/TiN

Force Modulation Cantilevers FMG01 with TiN conductive coating. Thickness of the coating is 20-30nm. Typical tip curvature radius is 35nm. For Force Modulation Mode FMG01 series with TiN conductive coating, resonant frequency 40-96 kHz, force constant 1-5N/m

Price on request

Available on back-order

Request a quote Ask about this product

Description

High Resolution NONCONTACT "GOLDEN" Silicon Cantilevers FMG01 series with TiN conductive coating

AFM cantilevers with TiN conductive coating well suit for a work in both conductive contact (Spreading resistance) and electrical semicontact (KPFM, EFM) modes.

Probes of this type:

  • offer perfect voltage stability (up to 6V) and wear resistance;
  • are well-conductive for work in Spreading resistance mode;
  • coated with reflective Au layer from the top side.
FMG01/TiN series specification:
Material Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size 3.4x1.6x0.3mm
Reflective side Au
Tip side TiN
Cantilever number 1 rectangular
Tip curvature radius 25 - 35 nm
Available coatings conductive PtIr, Au;

magnetic CoCr
Available probe bare, tipless, with Al reflective coating
AFM Cantilever
Cantilever series Cantilever length, L±5µm Cantilever width, W±3µm Cantilever thickness,

T±0.5 µm

 Resonant frequency, kHz Force constant, N/m
min typical max min typical max
FMG01 225 32 2.5 40 60 96 1 3 5

Options

Package size SKU Price (ex GST) Quote
15 G1815 On request Quote for FMG01/TiN 15
50 G1850 On request Quote for FMG01/TiN 50