Nano-Observer One Plus Atomic Force Microscope
CSInstruments Nano-Observer One Plus: a flexible, affordable AFM with a 100 × 100 µm scanner, HD-KFM surface potential and ResiScope resistance mapping.
Key features
- For essential research
- Performance, ease of use and affordability, for new and experienced AFM users.
- Modes
- Contact/LFM, oscillating/phase, non-contact, EFM, MFM, C-AFM, force modulation and PFM.
- HD-KFM
- High-definition Kelvin force microscopy for surface potential mapping.
- ResiScope II
- Resistance from 10² to 10¹² Ω.
- Easy positioning
- Compact head with pre-positioned tip; top and side views.
Specifications
From Concept Scientific Instruments' product page.
| XY scan range | 100 × 100 µm (±10%) |
|---|---|
| Z range | 15 µm (±10%) |
| Detection | Low-noise laser diode, 4-quadrant photodiode |
| Controller | 24-bit; built-in lock-in up to 6 MHz |
| Max data points | 4096 × 4096 |
| Scan speed | Up to 8 lines/s at 256 × 256 pixels |
| ResiScope II range | 10² to 10¹² Ω |
| Voltage range | ±10 V |
| Environment (options) | −40 °C to 450 °C with heating/cooling stage; humidity control; liquid cell |
| Software | Windows 10 and 11 |
Resources
- Product guide Scanning Probe Microscopy
- Article 5 Critical Factors When Comparing Scanning Electron Microscope Prices
- Article O₂ vs H₂ vs Ar: The Proven Plasma Cleaning Gas Selection Framework
- Article The best Conductive AFM for polymers and soft materials
- Article The most advanced module for Conductive AFM
