Deben Microtest MT200: a 200 N in-situ tensile, compression and horizontal bending stage for SEM, optical microscopes, AFM and XRD.
Key features
- In-situ testing
- Watch the most highly stressed area of the sample in an SEM, optical microscope, AFM or XRD system.
- Stays centred
- Symmetrical leadscrew moves both jaws, keeping the sample centred in the field of view.
- Live stress–strain
- MICROTEST software shows the curve as the test runs.
- Modes
- Tensile, compression and horizontal bending.
Specifications
From Deben UK's product page.
| Load cell | 200 N; linearity ±1% of full scale |
|---|---|
| Accuracy | ±0.5% |
| Resolution | Dynamic 0.1%, static 0.05% of full scale |
| Position readout | Extensometer, 300 nm resolution |
| Travel | 10 mm |
| Standard gauge length | 10–20 mm |
| Max sample size (L × W × H) | 50 × 15 × 10 mm |
| Control | MICROTEST software |





