KLA Filmetrics Profilm3D and Profilm3D-200: affordable white light interferometers for non-contact 3D surface topography with sub-nanometre resolution.
Key features
- Interferometry
- Vertical scanning and phase shifting interferometry, from nanometres to millimetres.
- TotalFocus
- 3D natural-colour images with every pixel in focus through the measured range.
- True-Color imaging
- Shows the sample's real colours, helpful for subtle or buried features.
- Enhanced Roughness Mode
- Better fidelity on sloped surfaces such as lenses, and on rough or low-reflectivity surfaces.
- Automation
- Automated focus with long piezo travel, and a long-travel XY stage for mapping and stitching.
Specifications
From KLA Instruments' product page.
| XY stage travel | 100 × 100 mm (Profilm3D); 200 × 200 mm (Profilm3D-200) |
|---|---|
| Z stage range | 100 mm |
| Objectives | Four-position turret, 5× (Michelson) to 100×; 10× to 100× Mirau |
| Wafer stage (option) | Manual R-theta stage for 50 to 200 mm wafers |
| Step height standards | 10 µm Cr on Si; optional multi-step 0.1, 2 and 4 µm |
Resources
Webinars and videos
From the manufacturer's own channels.
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Webinar · 19 October 2021 · KLA Instruments
Through-Glass and Deep Trench Measurements of Surface Topography
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Webinar · 8 September 2021 · KLA Instruments
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Webinar · 10 August 2021 · KLA Instruments
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Webinar · 13 April 2021 · KLA Instruments
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Webinar · 10 November 2020 · KLA Instruments
Automated Defect Detection, Mapping and Characterization with the Zeta 3D Optical Profiler
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Webinar · 29 October 2020 · KLA Instruments
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Webinar · 20 October 2020 · KLA Instruments
Profilm3D: Measuring Step Heights with White Light Interferometry
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Webinar · 25 June 2020 · KLA Instruments


