Trade-in your old AFM (any brand) and get an attractive discount on the new AFM from us.
Concept Scientific Instruments was founded by a team of experts with more than 20 years of experience in Atomic Force Microscopy. CSInstruments employs a qualified and dynamic team with expertise in mechanics, electronics and data processing. This expertise ensures innovation and performance in the production of AFM and helps achieve an excellent price/performance ratio.
High Resolution Atomic Force Microscope (AFM)
Through a smart choice of analog and digital processing, each signal is enhanced to avoid addition of noise and perform a fast feedback. The scanner is controlled by 24-bit D/A converters providing high precision scan to the Atomic Force Microscope (AFM). A built-in lock-in for accurate topography, phase or MFM/EFM/KFM and PFM measurements is coupled with low noise electronics to acquire highly resolved images and spectroscopy.
Expand your capabilities for different environments
The Nano-Observer is a modern AFM designed by experts at CSInstruments to serve advanced applications. The unique design of this instrument makes it highly powerful, versatile and suited to a range of environmental conditions such as gas, humidity control, temperature control and to liquid imaging. In addition, large optical windows have been installed making the Nano-Observer a perfect instrument for use in optical setups or couplings such as Raman, photovoltaics and IR illumination.
In addition to performance, the Nano-Observer is capable of several advanced modes which expand your field of investigation. Beside Contact/LFM and Oscillating/ Phase imaging, several modes are available to characterise mechanical viscoelasticity, adhesion of your samples as well as electrical properties (CAFM, ResiScope), electric and magnetic fields (MFM/EFM) and surface potential (standard KFM or HD-KFM). 8 real-time image channels are available to increase capability of analysis.
Ease of use
Compact and robust, the Nano-Observer fulfils the requirements for advanced users or beginners. It avoids laser alignment with the pre-positioned tip system. A top and side view of the tip/sample, combined with vertical motorised control, makes the pre-approach easy. Simple positioning can be done by combining the optical access with the X-Y translation stage.
Top and side views
A video color camera is provided with the AFM offering a helpful view from the top for tip/ sample positioning or side view to make the tip/sample approach easier.
» Sample/tip visibility
» Ease of use
» Avoids damaging sample or tip
» Better contrast by lateral illumination
Top and bottom illumination
» Bottom illumination can be used for Photovoltaic apps (bottom illumination + conductive measurements from the top)
» Bottom illumination can also be used to get better optical contrast for Biology (higher contrast / transmission)
» Top illumination is used for cantilever positioning