Benchtop SEM

Your Research Grade Benchtop SEM  

The EM-series of COXEM Scanning Electron Microscope product line features the most versatile Benchtop SEM available on the market today delivering the best price/performance ratio. This series retains most of the power and capabilities of Full Size SEMs while offering ease of use for beginners in Electron Microscopy. With a number of unique capabilities, the EM-40 is the most versatile Benchtop SEM in the world.

EM-40 is the only Benchtop SEM that has a motorised Z axis, allowing in-situ change of Working Distance. Operators can now switch between optimal Working Distance for SEM and EDS without breaking the vacuum and taking the sample out. Advanced SEMs come with moveable aperture strip with different sized apertures. Large size aperture provides greater signal for imaging and EDS work while small aperture provides very high resolution and depth of field. With EM-40, operators can move between different apertures by simply turning a knob and selecting the one delivering them the best result.

Benchtop SEMs have come a long way since their re-introduction in 2005. Gone are the days when these portable SEMs used to be limited in accelerating voltage of 15kV, resolution, selection of apertures, detectors and analytical capabilities. With growing competition in Portable SEM segment, Benchtop SEM prices from Scanning Electron Microscope suppliers have come down making electron microscopy more affordable and accessible than ever.

Previously the luxury of multiple detector selection, better electron optics and higher analytical accuracy was only available on full size SEMs which not only needed significantly higher investment but was also only accessible to experienced electron microscopists. The EM-40 Benchtop SEM breaks those barriers with excellent electron optics design and 30 kV maximum accelerating voltage delivering better than 5 nm resolution and high analytical accuracy. In addition a range of optional detectors can be installed for example simultaneous use of Electron Backscatter Diffraction (EBSD) and Energy Dispersive Spectroscopy (EDS). All of this while maintaining incredible ease of use!

Further reading: How to buy a Benchtop SEM and avoid a costly mistake

Sputter Coater

Samples that are not conductive usually need to be coated before taking SEM images. In BSE mode samples may be observed without coating. But due to charging, quality images cannot be obtained. COXEM’s versatile SPT-20 Sputter Coater  provides coating of multiple metals for a range of applications.

Click here for SEM sample plasma cleaners.