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Author Archives: NanoTech Solutions

17 Jun 2024

The best Conductive AFM for polymers and soft materials

by NanoTech Solutions | posted in: Atomic Force Microscopy | 0

There is now an increasing use of the electrical characterisation capabilities of AFM in nanotechnology-based fields such as energy harvesting, organic/polymer-based electronics, semiconductors etc. Flexible electronics based on organic compounds are gaining popularity as soft electrical materials. Currently, two different … Continued

What is an Optical Table with Honeycomb Breadboard?
15 Jun 2024

What is an Optical Table with Honeycomb Breadboard?

by NanoTech Solutions | posted in: Vibration Isolation | 0

An Optical Table with Honeycomb Breadboard is a specifically designed platform to isolate vibrations in sensitive techniques such as high-resolution microscopy, metrology, spectroscopy, nano-positioning etc. in the fields of photonics and optics. The specifically designed stiff optical tabletop significantly decreases … Continued

15 Jun 2024

The most advanced module for Conductive AFM

by NanoTech Solutions | posted in: Atomic Force Microscopy | 0

Common problems in Conductive AFM (Atomic Force Microscopy) include difficulty in managing high and low currents and avoiding unwanted side-effects such as the Joule, Bimetallic and local oxidation effects when using high currents. In order to produce accurate and reproducible … Continued

Posts pagination

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NanoTechnology Solutions Scanning Probe Microscope Modes

NanoTechnology Solutions Nano Observer high resolution AFM

Conductivity mapping with Resiscope
Resiscope

KLA Tencor-P-7 Stylus Profiler with monitor on top

Soft Resiscope AFM NanoTechnology Solutions

High resolution Atomic Force Microscope image of C36 molecules

NanoTechnology Solutions SEM Remote Plasma Cleaner on Tescan LYRA FIB SEM

NanoMegas Precession Diffraction in TEM

DEBEN Cathodoluminescence NanoTechnology Solutions Australia

KLA Stylus Profiler from NanoTechnology Solutions Australia with monitor on top showing surface metrology results

FEI Scios DualBeam Electron Microscope on Vibration Isolation Platform

Waviks photo-thermal-pathways Nanotechnology solutions

Tensile Testing Stage with Peltier Heating and Cooling NanoTechnology Solutions Deben UK

InSEM nanoindentation system installed on FEI SEM at NanoTechnology Solutions demo lab

NanoFlip Nanoindenter

AFM Colloidal Probes with micron sphere attached to tipless cantilever MikroMasch

Cathodoluminescence Detector NanoTechnology Solutions Deben UK

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