Top Visual AFM probes without coating for precise positioning of a tightly focused laser spot at the tip end – for investigations of optical effects between tip and sample (TERS, TEFS, s-SNOM etc).

TOP VISUAL NONCONTACT Silicon Cantilevers MikroMasch
VIT_P
Uncoated TOP VISUAL non-contact AFM probes (typical resonant frequency 300 kHz, typical force constant 50 N/m)
Price range: A$1,820.20 through A$4,476.40 Select options This product has multiple variants. The options may be chosen on the product page
TOP VISUAL NONCONTACT Silicon Cantilevers MikroMasch
VIT_P_C-A
TOP VISUAL Contact AFM probes (typical resonant frequency 16 kHz, typical force constant 0,3 N/m), Al reflective coating
Price range: A$1,236.90 through A$3,636.60 Select options This product has multiple variants. The options may be chosen on the product page
TOP VISUAL NONCONTACT Silicon Cantilevers MikroMasch
VIT_P/IR
TOP VISUAL non-contact AFM probes (typical resonant frequency 300 kHz, typical force constant 50 N/m), Au reflective coating
Price range: A$1,236.90 through A$3,636.60 Select options This product has multiple variants. The options may be chosen on the product page