Colloidal Probe Atomic Force Microscopy:
Colloidal Probe Atomic Force Microscopy requires a tip of known shape to be mounted cleanly on a consistently reproducible cantilever. These probes are known as “Colloidal Probes” and are used to study colloidal interactions between two surfaces and to quantify the interactive properties. The tip is formed using a spherical, colloidal particle that is attached to a tipless cantilever. Сolloidal probes are manufactured in the state-of-the-art clean room using micromachining techniques and a high precision, 6 axis, micromanipulator stage system. Near perfect micro-spheres of various materials are attached at the end of tipless cantilevers using a proprietary, clean, contamination free process.
Colloidal Probe Application:
Colloidal Probe applications include direct surface force measurement, colloidal interactions on the single particle-particle level, direct measurement of cell mechanics, measurement of adhesion forces, study of colloidal interactions between particle and surface. These are just a few application out of a fast growing field using colloidal probe technique.
Colloidal Probe Specification
Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
1 rectangular, tipless
Type of colloidal spheres
A – 5 um to 9 um
Available sizes of BSG spheres (SiO2 spheres available only with A size)
B – 10 um to 14 um
C – 15 um to 19 um
D – 20 um or more
Cantilever length, L±10µm
Cantilever width, W±6µm
Resonant frequency, kHz
Force constant, N/m
NanoTechnology Solutions is the exclusive distributor of these products in Australia and New Zealand.