NSG30_SS

A$ 1,116

10 Separated chips

Super Sharp AFM Probes for noncontact/Tapping modes NSG30 series, resonant frequency 200-440kHz, force constant 22-100N/m, Al reflective coating.

SKU: D2 Category:

Description

SUPER SHARP NONCONTACT “GOLDEN” Silicon Cantilevers NSG30 series

NSG30_SS series specification:

  1. Material: Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
  2. Chip size: 3.4 x 1.6 x 0.3mm
  3. Reflective side: Al
  4. Cantilever number: 1 rectangular
  5. Tip curvature radius: typical 2nm, guaranteed < 5nm

Cantilever specifications:

  1. Cantilever length, L±10µm: 125
  2. Cantilever width, W±5µm: 40
  3. Cantilever thickness, T±0.5 µm: 4
  4. Resonant frequency, kHz: 200 (Min), 320 (Typical), 440 (Max)
  5. Force constant, N/m: 22 (Min), 40 (Typical), 100 (Max)

Additional information

Weight 0.1 kg
Dimensions 8 × 5 × 0.8 cm

Reviews

There are no reviews yet.

Be the first to review “NSG30_SS”

Your email address will not be published. Required fields are marked *