AFM Probes for TAPPING/non-contact modes NSG10 series, resonant frequency 87-230kHz, force constant 1,45-15,1N/m

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High Resolution NONCONTACT “GOLDEN” Silicon AFM Probes NSG01 series


NSG01 series specification

MaterialSingle Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size3.4×1.6×0.3mm
Reflective sideAu
Cantilever number1 rectangular
Tip curvature radiustypical 6nm, guaranteed 10nm
Available coatingsconductive PtIr, TiN,Au;

magnetic CoCr

Available probebare, tipless, with Al reflective coating

AFM Cantilever

Cantilever seriesCantilever length, L±5µmCantilever width, W±3µmCantilever thickness,

T±0.5 µm

Resonant frequency, kHzForce constant, N/m

Additional information

Package size

15, 50


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