TGS2 AFM grating set
TGS_CERT
Set of calibration standards for SPM with International Calibration Cetficates. Intended for lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape
A$ 5,645 Add to cart
TGS2 AFM grating set
TGS_FULL
Full set of calibration standards for SPM lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape
A$ 2,126 Add to cart
Asylum Research Atomic Force Microscope Scanner Calibration Grating set
TGS1
Grating set for Z-axis SPM calibration with three different height range - 20nm, 110nm, 520nm
A$ 370 Add to cart
Asylum Research Atomic Force Microscope Scanner Calibration Grating set
TGS1_PTB
Calibration grating set TGS1 (consists of three gratings TGZ1, TGZ2, TGZ3) with PTB tracable certificate
A$ 2,774 Add to cart
Asylum Research Atomic Force Microscope Scanner Calibration Grating set
TGS1F
Grating set for Z-axis SPM calibration with four different height range - 20nm, 110nm, 520nm, 1400nm
A$ 533 Add to cart
TGS2 AFM grating set
TGS2
Grating set for SPM lateral and vertical calibration, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape.
A$ 925 Add to cart