TGS_FULL

(1 customer review)

A$ 2,126

Full set of calibration standards for SPM lateral and vertical calibration (including submicron calibration and simultaneuos calibration in X, Y and Z directions) , detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip shape

Available on back-order

SKU: CG10 Category:

Description

Grating set TGSFull consists of 8 calibration gratings – TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1, TGQ1.

Grating set TGSFull can be used for:

  • SPM simultaneuos calibration in X, Y and Z directions;
  • submicron SPM calibration in X or Y direction;
  • lateral and vertical calibration;
  • detection of lateral non-linearity;
  • detection of hysteresis, creep, and cross-coupling effects;
  • detection of angular distortion;
  • for 3-D visualization of the scanning tip;
  • determination of tip sharpness parameters (aspect ratio and curvature radius), tip degradation and contamination control.

 

NanoTechnology Solutions is the exclusive distributor of these products in Australia and New Zealand.

Additional information

Weight0.1 kg
Dimensions8 × 5 × 0.8 cm

1 review for TGS_FULL

  1. James

    Thank you for the prompt delivery. The kit helps with all my calibrations.

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