NSG01/TiN

A$ 644A$ 1,689

Noncontact SPM probes NSG01 series with TiN conductive coating, resonant frequency 87-230kHz, force constant 1,45-15,1N/m

Clear selection
SKU: G13 Category:

Description

High Resolution NONCONTACT “GOLDEN” Silicon Cantilevers NSG01 series with TiN conductive coating

 

AFM cantilevers with TiN conductive coating well suit for a work in both conductive contact (Spreading resistance) and electrical semicontact (KPFM, EFM) modes.

Probes of this type:

  • offer perfect voltage stability (up to 6V) and wear resistance;
  • are well-conductive for work in Spreading resistance mode;
  • coated with reflective Au layer from the top side.

 

NSG01/TiN series specification:
 

MaterialSingle Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size3.4×1.6×0.3mm
Reflective sideAu
Tip sideTiN
Cantilever number1 rectangular
Tip curvature radius25 – 35 nm
Available probebare, tipless, with Al reflective coating

 

AFM Cantilever

Cantilever seriesCantilever length, L±5µmCantilever width, W±3µmCantilever thickness,

T±0.5 µm

Resonant frequency, kHzForce constant, N/m
mintypicalmaxmintypicalmax
NSG01125302.0871502301.455.115.1

Additional information

WeightN/A
DimensionsN/A
Package size

15, 50

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