AFM and TERS Probes
Showing 21–40 of 67 results

HA_C_tipless
High Accuracy Contact AFM probes HA_C series without tips, each chip has 2 cantilevers, resonant frequency 37 kHz / 19 kHz, force constant 0,65 N/m / 0,26 N/m

HA_C/Au
High Accuracy Contact AFM probes HA_C series with Au tip and reflective coating, each chip has 2 cantilevers, resonant frequency 37 kHz / 19 kHz, force constant 0,65 N/m / 0,26 N/m

















HA_C/Pt
High Accuracy Contact AFM probes HA_C series with Pt tip and reflective coating, each chip has 2 cantilevers, resonant frequency 37 kHz / 19 kHz, force constant 0,65 N/m / 0,26 N/m

















HA_CNC
High Accuracy Contact AFM probes HA_CNC series, each chip has 2 cantilevers, resonant frequency 46 kHz / 66 kHz, force constant 1.0 N/m / 1.5 N/m

















HA_FM
High Accuracy Force Modulation AFM probes HA_FM series, each chip has 2 cantilevers, resonant frequency 114 kHz / 77 kHz, force constant 6 N/m / 3.5 N/m

















HA_FM/Au
High Accuracy Force Modulation AFM probes HA_FM series with Au conductive coating, each chip has 2 cantilevers, resonant frequency 114 kHz / 77 kHz, force constant 6 N/m / 3.5 N/m

















HA_FM/CoFe
AFM cantilevers for work in the semicontact mode HA_FM (High Accuracy Force Modulation). Each chip contains two cantilevers with resonance frequencies 114 kHz / 77 kHz and force constant 6 N/m / 3.5 N/m. Probes are covered with CoFe layer for MFM measurements

















HA_FM/W2C+
High Accuracy High Resonance frequency noncontact AFM probes HA_FM series with stable and wear-resistant long lifetime W2C conductive coating, each chip has 2 cantilevers,resonant frequency 114 kHz / 77 kHz, force constant 6 N/m / 3.5 N/m. W2C+ conductive coating is modified to provide better stability in high humidity conditions

















HA_HR
High Accuracy High Resonance frequency non-contact AFM probes HA_HR series, each chip has 2 cantilevers, resonant frequency 380 kHz / 230 kHz, force constant 34 N/m / 17 N/m

















HA_HR_DCP
Stable and nondestructive, wear resistant probes with conductive diamond coating. High Accuracy High Resonance frequency noncontact AFM probes HA_HR series with doped diamond conductive coating, each chip has 2 cantilevers, resonant frequency 380 kHz / 230 kHz, force constant 34 N/m / 17 N/m

















HA_HR_DCP
Stable and nondestructive, wear resistant probes with conductive diamond coating. High Accuracy High Resonance frequency noncontact AFM probes HA_HR series with doped diamond conductive coating, each chip has 2 cantilevers, resonant frequency 380 kHz / 230 kHz, force constant 34 N/m / 17 N/m


HA_HR_DLC
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series HA_HR

















HA_HR/Au
High Accuracy NonContact AFM probes HA_NC series with Au conductive coating, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m

















HA_HR/Pt
High Accuracy High Resonance frequency noncontact AFM probes HA_HR series with Pt conductive coating, each chip has 2 cantilevers, resonant frequency 380 kHz / 230 kHz, force constant 34 N/m / 17 N/m

















HA_HR/W2C+
High Accuracy High Resonance frequency noncontact AFM probes HA_HR series with stable and wear-resistant long lifetime W2C conductive coating, each chip has 2 cantilevers, resonant frequency 380 kHz / 230 kHz, force constant 34 N/m / 17 N/m. W2C+ conductive coating is modified to provide better stability in high humidity conditions

















HA_NC
High Accuracy Non-contact AFM probes HA_NC series, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m

















HA_NC_DCP
Stable and nondestructive, wear resistant probes with conductive diamond coating. High Accuracy High Resonance frequency noncontact AFM probes HA_NC series with doped diamond conductive coating, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m.


HA_NC_tipless
High Accuracy Non Contact AFM cantilevers HA_NC series without tips, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 8 N/m / 3.5 N/m

















HA_NC/W2C+
High Accuracy High Resonance frequency noncontact AFM probes HA_NC series with stable and wear-resistant long lifetime W2C conductive coating, each chip has 2 cantilevers, resonant frequency 235 kHz / 140 kHz, force constant 12 N/m / 3.5 N/m. W2C+ conductive coating is modified to provide better stability in high humidity conditions
HA_NCW
Pack of 5 Whisker Type probes for Tapping/noncontact modes. Standard length of the Whisker for tapping/noncontact modes is 1.0um (other Whisker length can be considered). At customer's requirement tip side of cantilever can be coated by conductive coating.