AFM and TERS Probes
Showing 41–60 of 67 results

MF
SNOM fiber probes with glued quartz tuning-forks for NT-MDT systems

MF00
Set of 10 SNOM probes, without tuning forks


NSG01_BIO/Au
5 colloidal probes for Noncontact/Tapping Modes with SiO2 spheres, size 270/650/900nm, gold coating on the reflective chip side
NSG01/Au
Noncontact cantilevers NSG01, NSG10, NSG03, NSG30, FMG01 series with Au conductive coating. Thickness of the coating is 20-30nm. Typical tip curvature radius is 35nm. Noncontact SPM probes NSG01 series with Au conductive coating, resonant frequency 87-230kHz, force constant 1,45-15,1N/m


NSG10_DLC
Super Sharp Diamond-Like Carbon (DLC) tips with typical curvature radius 1nm grown on the probe series NSG10
NSG10/Au
Noncontact cantilevers NSG01, NSG10, NSG03, NSG30, FMG01 series with Au conductive coating. Thickness of the coating is 20-30nm. Typical tip curvature radius is 35nm. Noncontact SPM probes NSG10 series with Au conductive coating, resonant frequency 140-390kHz, force constant 3,1-37,6N/m
NSG30_SS
10 Separated chipsSuper Sharp AFM Probes for noncontact/Tapping modes NSG30 series, resonant frequency 200-440kHz, force constant 22-100N/m, Al reflective coating.
NSG30/Au
Noncontact cantilevers NSG01, NSG10, NSG03, NSG30, FMG01 series with Au conductive coating. Thickness of the coating is 20-30nm. Typical tip curvature radius is 35nm. Noncontact probes NSG30 series with Au conductive coating, resonant frequency 240-440kHz, force constant 22-100N/m