AFM Calibration (individual)

Buy AFM calibration gratings online from a local supplier backed by outstanding customer service and support. NanoTechnology Solutions hold exclusive rights to import ScanSens GmbH range of AFM calibration gratings in Australia and New Zealand.

Test Grating TGQ1-2
TGQ1
Calibration grating TGQ1 is intended for simultaneous calibration in X,Y,and Z directions.
A$1,053.17 Add to cart
Test Grating TGT1-1
TGT1
Test grating TGT1 is intended for for 3-D visualization of the scanning tip, determination of tip sharpness parameters, tip degradation and contamination control
A$1,053.17 Add to cart
Asylum Research Atomic Force Microscope Scanner Calibration Grating set
TGZ
Calibration grating TGZ for SPM Z-axis calibration
Price range: A$387.60 through A$967.10 Select options This product has multiple variants. The options may be chosen on the product page
Placeholder
TDG01
Diffraction grating TDG01 is intended for submicron calibration scanning probe microscopes (SPM) in the X or Y direction.
A$3,016.00 Add to cart
TGF1 AFM Calibration standard
TGF1
Test grating TGF1 is intended for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity and lateral force calibration
A$703.57 Add to cart
AFM Test Grating TGG1-1
TGG1
Test grating TGG1 is intended for SPM calibration in X or Y axis, detection of lateral and vertical scanner nonlinearity, detection of angular distortion, tip characterization
A$703.57 Add to cart
AFM tip aspect ratio Test Grating TGX1
TGX1
Test grating TGX1 is intended for lateral calibration of SPM scanners, detection of lateral non-linearity, hysteresis, creep, and cross-coupling effects, determination of the tip aspect ratio
A$703.57 Add to cart