Research laboratories across Australia, Europe, and North America face a recurring challenge: selecting the appropriate surface characterisation technology for nanoscale measurements. The decision between an Atomic Force Microscope (AFM), Scanning Electron Microscope (SEM), and Optical Profiler directly impacts data quality, … Continued
Purchasing a Scanning Electron Microscope represents one of the most significant capital investments a research facility or industrial laboratory will make. The scanning electron microscope price spectrum ranges dramatically: from approximately $90,000 for entry-level benchtop systems to well over $1 … Continued
Researchers at leading universities and industrial laboratories worldwide face a common challenge in sample preparation: selecting the wrong process gas in the plasma cleaning process can compromise surface characterisation results, damage delicate substrates, or leave residual contamination that undermines months … Continued
Full-size Scanning Electron Microscopes (SEMs) have been restricted in use to experienced Electron Microscopists for decades. The advent of Benchtop SEM in the last two decades made Electron Microscopy accessible to beginners. These small systems have gained popularity due to … Continued
Tabletop SEM units tend to be restricted to 5, 10, 15 kV Accelerating Voltage steps. Full-size SEMs offer Accelerating Voltage range from 0.3 kV to 30 kV in order to allow users to choose the right conditions for different samples … Continued