Atomic Force Microscope vs. SEM vs. Optical Profiler: The Proven Framework for Choosing the Right Tool

Research laboratories across Australia, Europe, and North America face a recurring challenge: selecting the appropriate surface characterisation technology for nanoscale measurements. The decision between an Atomic Force Microscope (AFM), Scanning Electron Microscope (SEM), and Optical Profiler directly impacts data quality, … Continued

O₂ vs H₂ vs Ar: The Proven Plasma Cleaning Gas Selection Framework

Researchers at leading universities and industrial laboratories worldwide face a common challenge in sample preparation: selecting the wrong process gas in the plasma cleaning process can compromise surface characterisation results, damage delicate substrates, or leave residual contamination that undermines months … Continued

Sedimentation Measurements

Sedimentation measurements are used to observe precipitation measurements for various batches of finely dispersed powders. This measurement method can be used to evaluate the sedimentation, wetting, and dispersibility of powders. Wetting property using initial dispersibility of powder: Use the sedimentation … Continued